attēls | numurs daļa | Zīmols | apraksts | daudzums | Nopirkt |
---|---|---|---|---|---|
SDFSD | Package S32QW SDFSD TEST New original parts | 11712 pieces | |||
NULL | Package SMD or Through Hole NULL TEST-1-GR New original parts | 32921 pieces | |||
ORIGINAL | Package QFN-6 ORIGINAL TEST-2 New original parts | 68185 pieces | |||
ONsemi | Package PLCC28 ONsemi TEST RUN New original parts | 69690 pieces | |||
BCD | Package TO-220 BCD TEST1 New original parts | 35721 pieces | |||
ORIGINAL | Package SOD523 ORIGINAL test12 New original parts | 65270 pieces | |||
ORIGINAL | Package SOD523 ORIGINAL test123 New original parts | 65270 pieces | |||
TI | Package TSSOP56 TI TEST123456789 New original parts | 21476 pieces | |||
NS | Package TSSOP-28 NS TEST1H2S04 New original parts | 23506 pieces | |||
ORIGINAL | Package QFN ORIGINAL TEST1QFN7X7 New original parts | 9212 pieces | |||
Vishay Semiconductor Opto Division | PHOTOTRANSISTOR NPN SIDE VIEW | 441135 pieces | |||
ORIGINAL | Package QFN ORIGINAL TEST6 New original parts | 9212 pieces | |||
PERICOM | Package QFN64 PERICOM TEST7.5X7.5 New original parts | 56628 pieces | |||
TEMIC | Package SOP-24L TEMIC TESTDE New original parts | 22072 pieces | |||
ORIGINAL | Package SMD ORIGINAL TESTDELAM New original parts | 19112 pieces | |||
AIT | Package QFN AIT TESTDIE4X3-1 New original parts | 18880 pieces | |||
ONsemi | Package PLCC28 ONsemi TESTING-EFREN New original parts | 69690 pieces | |||
ORIGINAL | Package SMTDIP ORIGINAL TESTMADC1-20090723_13:17 New original parts | 4600 pieces | |||
PGM | Package SMD or Through Hole PGM TESTMADC1-20120404_10:20 New original parts | 21920 pieces | |||
PGM | Package SMD or Through Hole PGM TESTMADC2_20090723_13:18 New original parts | 21798 pieces |